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Electronic information

Keithley Semiconductor Characterization pulse measurement system provides functionality

In Electronic Infomation Category: R | on December   1, 2010

Keithley (Keithley Instruments) announced the launch can occur with the measurement of pulse Model 4200-SCS Semiconductor Characterization Measurement System - PIV (Pulse IV) package. This is the companys Model 4200-SCS to buy new kit, perform laboratory grade DC device characterization measurements and LP2952IM datasheet and real-time mapping, and LP2952IM price and high precision and LP2952IM suppliers and resolution of sub-femto ampere analysis, such as high K value for materials, thermal components and high-end memory and so on.

The company said that when the semiconductor technology to the 65nm node and higher order, in addition to the DC output measurement - measurement, the need to more effectively measure the components of new materials and new features, such as charge trapping and SOI high-K (solicon on insulator) devices will be self-heating. Although the developers have recognized the importance of the test pulse, but no commercial solution executable simple, accurate and repeatable pulse measurements.

Model 4200-SCS PIV Package with pulse function, the integration of pulse generation, pulse measurement, combined with patent-pending software and a simplified DUT wire link, to provide an effective solution. Users do not need to use a bunch of equipment to measure, connect the complex line, or use self-developed software and inaccurate measurements.

PIV package is built on the new dual channel pulse generator card, which is characterized by two separate channels, with a frequency range of 1Hz to 50MHz. Can produce one of only 10 nanoseconds (nanoseconds) pulse, can 65nm SOI devices and other components and processes to achieve the following isothermal pulse measurement, the pulse edge for the charge trapping, AC stress testing, and storage device testing can accurately output measurements.

Users can control several pulse parameters such as pulse width, duty cycle, rise and fall time, amplitude, and offset. The combination of the software package can also control the pulse setting and driving dual-channel pulse generator, trigger, and the implementation of pulse measurement, collect and display data. PIV package also includes the implementation of pulse IV testing procedures and charge capture example, the software can save development time and costs.

In addition, dual-channel pulse generator card can also be used as an integrated on the Model 4200-SCS pulse generator. Suitable for general purpose pulse generator failure analysis, charge pump, flash memory testing in a timely manner Zhongfa Sheng. Pulse card contains the software with user-friendly graphical interface.

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