Electronic information
NI successfully host the sixth "Chinese PXI Technology and Applications Forum"
In Electronic Infomation Category: R | on July 10, 2011
Few days ago, National Instruments (National Instruments, referred to as NI) announced in Beijing, China successfully hosted the sixth "Chinese PXI Technology and EP2C5F256C8N datasheet and Applications Forum" (PXI Technology & Application Conference, the PXI TAC). Nearly 600 engineers and EP2C5F256C8N price and technicians in related fields who attended the meeting. In addition to hosting providers outside NI, PXI eight well-known domestic and EP2C5F256C8N suppliers and foreign suppliers, such as Aeroflex, MAC Panel, VPC, Pickering, ADLINK Technology, and Global China Beijing Branch, Shanghai, multiple star instrument, Shaanxi Haitai to be audience to the latest PXI-based products and solutions. This event also specially invited to the PXI Systems Alliance Technical Committee and Chairman of NI R & D headquarters, Mr. Mark Wetzel, chief engineer and deputy director of Institute of Tsinghua University Professor Lu Qingchun car for the opening keynote speech for the conference. P>
Event last year, PXI TACs software as the core of the modular system architecture, conform to the mainstream market trends, has been widely recognized in the industry; this year, as the leader in test and measurement industry, NI outlook based on the framework for further 2009 automated test application development trends, including multi-core technology for parallel testing; custom FPGA-based instrument design; based on software radio frequency testing; protocol-aware (Proto col-Aware) semiconductor validation and testing, and further application of the PXI platform extending from the test area to the control, design and other fields. Technical presentations throughout the conference site and products are reflected in the application of these five trends. P>
Special provision of the three-day event at the venue of the seminar: "automated test platform project," focused on the interpretation of a software-centric modular test platform used to build automated test applications; "special industrial applications" focus on the PXI platform from research to production line, from DC to RF applications and other industry sectors; "PXI Developer Topics" is a being or will be designed to provide technical PXI module, engineers training and guidance. Each branch of the venue, audience participants to interact actively with speech engineers to discuss engineering problems. Display area in the field applications, NI PXI together eight other vendors and integrators, not only with the participating engineers to share the PXI technology application and development of the latest industry trends, while also providing a good experience with customer communications technology and the sharing of successful Case of the platform. P>
Is worth mentioning that, in order to enhance the users activity participation, this PXI TAC for the first time the user uses the pre-lecture content online vote for the link, the user has created a truly think, the technology allows users to call the shots meeting. According to a survey the scene this years conference, up to 99% of the participants felt that the event actually work for their great help, nearly 85% of users will PXI as their first choice for future test and measurement platform. P>
Indeed, in a software-centric modular instrument architecture has become the main trend of test and measurement industry, the occasion, FPGA, multi-core technology and other new business for the measurement and automation industry is bound to lead to further innovation and change, and PXI platform with its open architecture, flexibility and the advantages of technology-based PC, will take full advantage of these new technologies, thus always leading automated testing of new trends; At the same time, we are pleased to see that, PXI TAC has gradually played their brand effect, as the industry engineers to share the latest testing technology, the latest market trends in the exchange platform! P >