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LP2952IM Suppliers

Keithley Semiconductor Characterization pulse measurement system provides functionality

In Electronic Infomation Category: K | on 2010/12/1 15:57:00

Keithley (Keithley Instruments) announced the launch can occur with the measurement of pulse Model 4200-SCS Semiconductor Characterization Measurement System - PIV (Pulse IV) package. This is the companys Model 4200-SCS to buy new kit, perform laboratory grade DC device characterization measurements and LP2952IM datasheet and real-time mapping, and LP2952IM price and high precision and IC LP2952IM suppliers and resolution of sub-femto ampere analysis, such as high K value for materials, thermal components and high-end memory and so on. The company said that when the semiconductor technology to the 65nm node and higher order, in addition to the DC output measurement - measurement, the need to more effectively measure the components of new materials and new features, such as charge trapping and SOI high-K (solicon on insulator) devices will be self-heating...
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